22 results
Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1223-1224
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- August 2015
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Resolving 45 pm with 300 kV Aberration Corrected STEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 124-125
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- August 2014
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Reconstruction of Atomic Resolution STEM Images Using the Diffraction-Imaging Method with an Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1076-1077
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- July 2011
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Catalytic Mediation by Ti-deficient Ti1-xO2 pillars at a Gold Nanoparticle-TiO2 Boundary
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 540-541
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- July 2011
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Direct Imaging of Hydrogen Atoms in a Crystal by Annular Bright-field STEM
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1278-1279
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- July 2011
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Auto-Tuning of Aberrations Using High-Resolution STEM Images by Auto-Correlation Function
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 09 April 2017, pp. 1308-1309
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- July 2011
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Counting the Number of Lithium Atoms in the Diffusion Channel by Annular Bright Field imaging
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1580-1581
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- July 2011
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Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 80-81
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- July 2010
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Cross-section of Asbestos Prepared for TEM/STEM with Ion Slicer
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 14-15
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- July 2010
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Visualization of Lithium Atoms in LiV2O4 by a Spherical Aberration Corrected Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 162-163
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- July 2010
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Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 164-165
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- July 2009
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Development of a 200kV Atomic Resolution Analytical Electron Microscope
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 188-189
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- July 2009
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Adatom on Graphene, Directly Imaged by Aberration Corrected TEM at 300kV
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1476-1477
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- July 2009
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Electron Energy Loss Spectroscopy of Graphene Identified by Aberration, Corrected TEM at 300kV
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1484-1485
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- July 2009
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In-Situ Observation of Au/TiO2 Catalyst in Oxygen-Gas Environments
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 692-693
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- July 2009
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Spherical Aberration Corrected TEM/STEM Analysis of La2O3 Thin Film Deposited on Si (001) Substrate
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1010-1011
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- July 2009
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Development of a 200kV Atomic Resolution Analytical Electron Microscope
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- Microscopy Today / Volume 17 / Issue 3 / May 2009
- Published online by Cambridge University Press:
- 14 March 2018, pp. 8-11
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- May 2009
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Atomic Resolution Elemental Maps by Core Level EELS Using Cs Corrected STEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1372-1373
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- August 2008
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Direct Observation of Site Hopping of Individual Dopant Atoms in Si Crystal, by Cs-corrected STEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1186-1187
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- August 2007
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Three-Dimensional Magnetic Domain Analysis by Lorentz Tomography
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 984-985
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- August 2006
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