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Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM
Published online by Cambridge University Press: 23 September 2015
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- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1223 - 1224
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- Copyright © Microscopy Society of America 2015
References
[2] The author (MW) wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229.Google Scholar
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