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Development of a 200kV Atomic Resolution Analytical Electron Microscope

Published online by Cambridge University Press:  26 July 2009

I Ishikawa ,
E Okunishi ,
H Sawada ,
Y Okura ,
K Yamazaki ,
T Ishikawa ,
M Kawazu ,
M Hori ,
M Terao  and
M Kanno
...Show all authors
I Ishikawa
Affiliation:
JEOL Ltd Japan
E Okunishi
Affiliation:
JEOL Ltd Japan
H Sawada
Affiliation:
JEOL Ltd Japan
Y Okura
Affiliation:
JEOL Ltd Japan
K Yamazaki
Affiliation:
JEOL Ltd Japan
T Ishikawa
Affiliation:
JEOL Ltd Japan
M Kawazu
Affiliation:
JEOL Ltd Japan
M Hori
Affiliation:
JEOL Ltd Japan
M Terao
Affiliation:
JEOL Ltd Japan
M Kanno
Affiliation:
JEOL Ltd Japan
S Tanba
Affiliation:
JEOL Ltd Japan
Y Kondo
Affiliation:
JEOL Ltd Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 188 - 189
Copyright
Copyright © Microscopy Society of America 2009