Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 28
Towards the optimization of materials and processes for flexible organic electronics devices
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- 27 March 2009, 12502
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- Cited by 27
Micromechanical modelling for tension–compression pseudoelastic behavior of AuCd single crystals
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- 15 November 1998, pp. 125-132
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- Cited by 27
Current-voltage-temperature analysis of inhomogeneous Au/n-GaAs Schottky contacts
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- 18 August 2005, pp. 79-86
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- Cited by 27
Three-dimensional atomic magnetometry
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- 30 January 2012, 21004
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- Cited by 27
Comparative determination of the electron temperature in Ar- and N2-plasmas with electrostatic probes, optical emission spectroscopy OES and energy dispersive mass spectrometry EDMS
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- 15 July 2001, pp. 49-56
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- Cited by 27
Cascade sliding mode control of a field oriented induction machine drive
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- 15 September 1999, pp. 217-225
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- Cited by 27
Removal of pollutants by plasma catalytic processes*
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- 23 November 2004, pp. 319-324
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Extracting parameters from the current-voltage characteristics of polycrystalline octithiophene thin film field-effect transistors
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- 28 June 2007, pp. 7-16
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Effect of thickness and physical properties of films on the thermal behavior of a moving rough interface
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- 22 March 2004, pp. 29-34
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- Cited by 27
Transport coefficients of plasmas consisting of insulator vapours: Application to PE, POM, PMMA PA66 and PC
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- 21 January 2004, pp. 169-182
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- Cited by 27
Tomographic diffractive microscopy of transparent samples
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- 16 April 2008, pp. 29-35
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- Cited by 27
Integration of TiO2 nanotube arrays into solid-state dye-sensitized solar cells
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- 28 January 2011, 20601
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- Cited by 27
Multi-band metamaterial absorber using cave-cross resonator
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- 14 November 2011, 31301
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- Cited by 27
Atomic force microscopy: a powerful tool for surface defect and morphology inspection in semiconductor industry
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- 15 July 2004, pp. 101-106
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- Cited by 27
Critical dimension of biperiodic gratings determined by spectral ellipsometry and Mueller matrix polarimetry
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- 04 June 2008, pp. 351-359
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On physical properties of undoped and Al and In doped zinc oxide films deposited on PET substrates by reactive pulsed laser deposition
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- 02 September 2010, 33212
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- Cited by 26
Causal modeling and identification of a travelling wave ultrasonic motor
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- 19 December 2002, pp. 151-159
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- Cited by 26
Contacts for semitransparent organic solar cells*
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- 22 February 2007, pp. 261-264
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Influence of Cr3+ ions on the structure and certain physical properties of PbO-As2O3 glasses
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- 15 October 2001, pp. 11-22
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- Cited by 26
Microstructure and morphology evolution in chemically deposited semiconductor films: 4. From isolated nanoparticles to monocrystalline PbS thin films on GaAs(100) substrates
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- 13 December 2006, pp. 39-47
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