Hostname: page-component-76fb5796d-5g6vh Total loading time: 0 Render date: 2024-04-26T16:33:53.884Z Has data issue: false hasContentIssue false

Microstructure and morphology evolution in chemically deposited semiconductor films: 4. From isolated nanoparticles to monocrystalline PbS thin films on GaAs(100) substrates

Published online by Cambridge University Press:  13 December 2006

A. Osherov
Affiliation:
Department of Materials Engineering and the Ilse Katz Center for Nanoscience and Nanotechnology, Ben-Gurion University of the Negev, Beer-Sheva 84105, Israel
V. Ezersky
Affiliation:
Department of Materials Engineering and the Ilse Katz Center for Nanoscience and Nanotechnology, Ben-Gurion University of the Negev, Beer-Sheva 84105, Israel
Y. Golan*
Affiliation:
Department of Materials Engineering and the Ilse Katz Center for Nanoscience and Nanotechnology, Ben-Gurion University of the Negev, Beer-Sheva 84105, Israel
Get access

Abstract

Thin lead sulfide films were grown on single crystal GaAs(100) substrates by chemical deposition using Pb(NO3)2 and CS(NH2)2 with excess of NaOH in aqueous solution at a range of deposition temperatures 0–50 °C. The microstructure and morphology evolution were studied as a function of the deposition conditions, resulting in a wide range of microstructures. Ultrahigh resolution scanning electron microscopy and atomic force microscopy indicated a systematic change in particle shape and surface morphology as a function of deposition temperature and deposition time. X-ray diffraction of 200–500 nm thick films indicated a dominant $\langle 110\rangle$ texture throughout the deposition temperature range. At deposition temperatures above 40 °C, single crystal films were obtained. Cross-sectional transmission electron microscopy analyses showed a unique (011)PbS||(100)GaAs and [100]PbS||[011]GaAs orientation relationship.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

P. Capper, C.T. Eliot, Infrared Detectors and Emitters: Materials and Devices (Kluver academic publishers, 2001)
Ricolleau, C., Gandais, M., Gacoin, T., Boilot, J.P., J. Cryst. Growth 166, 769 (1996) CrossRef
Kumar, S., Sharma, T.P., Zulfequar, M., Husain, M., Physica B 325, 8 (2003) CrossRef
J. Puisco, S. Tamulevicius, G. Laukaitis, S. Lindroos, M. Leskala, V. Snitka, Thin Solid Films 403, 404, 457 (2002)
Shandalov, M., Golan, Y., Eur. Phys. J. Appl. Phys. 24, 13 (2003) CrossRef
Shandalov, M., Golan, Y., Eur. Phys. J. Appl. Phys. 28, 51 (2004) CrossRef
Shandalov, M., Golan, Y., Eur. Phys. J. Appl. Phys. 31, 27 (2005) CrossRef
Valenzuela-Jauregui, J.I., Ramirez-Bon, R., Mendoza-Galvan, A., Sotelo-Lerma, M., Thin Solid Films 441, 104 (2003) CrossRef
Pop, I., Nascu, C., Ionescu, V., Indrea, E., Bratu, I., Thin Solid Films 307, 240 (1997) CrossRef
Elabd, H., Steckl, A.J., J. Appl. Phys. 51, 726 (1980) CrossRef
Elabd, H., Steckl, A.J., Vidinski, W., Sol. Cells 1, 199 (1980) CrossRef
Sarma, Y.S., Acharya, H.N., Misra, N.K., J. Mater. Sci. 21, 137 (1986) CrossRef
Gaiduk, A.P., Goroshko, N.N., Gaiduk, P.I., Vestsi Natsyyanal'nai Akademii Navuk Belarusi 2, 46 (2005)
Davis, J.L., Norr, M.K., J. Appl. Phys. 37, 1670 (1966) CrossRef
Guizzetti, G., Filippini, F., Reguzzoni, E., Samoggia, G., Phys. Status Solidi A 6, 605 (1971) CrossRef
Isshiki, M., Endo, T., Masumoto, K., J. Electrochem. Soc. 137, 2697 (1990) CrossRef
Watanabe, S., Mita, Y., J. Electrochem. Soc. 116, 989 (1969) CrossRef
Sharma, B.L., Mukerjee, S.N., Phys. Status Solidi A 2, K21 (1970) CrossRef
Bernabucci, F., Margaritondo, G., Migliorato, P., Phys. Status Solidi A 15, 621 (1973) CrossRef
Meldrum, F.C., Flath, J., Knoll, W., J. Mater. Chem. 9, 711 (1999) CrossRef
Flath, J., Meldrum, F.C., Knoll, W., Thin Solid Films 327–329, 506 (1998) CrossRef
Seghaier, S., Kamoun, N., Brini, R., Amara, A.B., Mater. Chem. Phys. 97, 71 (2006) CrossRef
Ni, Y., Wang, F., Liu, H., Yin, G., Hong, J., Ma, X., Xu, Z., J. Cryst. Growth 262, 399 (2004) CrossRef
Ni, Y., Liu, H., Wang, F., Hong, J., Ma, X., Xu, Z., Cryst. Res. Technol. 39, 200 (2004) CrossRef
G.H. Blount, P.J. Schreiber, D.K. Smith, R.T. Tamada, J. Appl. Phys. 44, 978 (1973)
Larramendi, E.M., Calzadilla, O., Gonzalez-Arias, A., Hernandez, E., Ruiz-Garcia, J., Thin Solid Films 389, 301 (2001) CrossRef
Dobson, K.D., Hodes, G., Mastai, Y., Sol. Energy Mater. Sol. C. 80, 283 (2003) CrossRef
G. Hodes, Chemical Solution Deposition of Semiconductor Films (Marcel Dekker, Inc., New York-Basel, 2002)
Gorer, S., Hodes, G., J. Phys. Chem. 98, 5338 (1994) CrossRef
Shandalov, M., Golan, Y., Chem. Mater. 18, 3593 (2006) CrossRef