Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Anniversary Session: Celebrating 50 Years of Microanalysis

Abstract

Testing a New Electron Microprobe and Developing New Analytical Protocols

Characterization of Complex Industrial Specimens by Hyperspectral EPMA Mapping

EPMA and Quantitative EDS of Rare Earth Elements in Geochronological Reference Materials

Quantitative Electron Probe Microanalysis of Fe at Low Accelerating Voltage Using the Lα and Lβ X-ray Lines

Carbon Bonding Determination with XES Using a TES Microcalorimeter Detector

Advantage of Specimen Heating in FE-EPMA for Performing Quantitative Trace Carbon Analysis in Steel Materials

A New Detection Metric for EDS Detectors

Very Large Area Phase Mapping of a Petrographic Thick Section using Multivariate Statistical Analysis of EDS Spectral Images

New Developments in Compositional Stage Mapping by EPMA and Micro-XRF

Implementing High Performance Workstation Virtualization for Data Processing in a Multi-User Microscopy Facility.

EPMA Characterisation of Quartz and Quartz-Cement from a Triassic Sandstone

Phenom Desktop SEM for Gunshot Residue and Cathodoluminescence Imaging and Analysis

Characterisation of Acid Resistant Concrete Exposed to Sulphuric Acid Using SEM, EDS and X-Ray Mapping

Composition and Crystal Orientation Mapping of nano-scale multi-phase Rapid Solidification Microstructures in hypo-eutectic Al-Cu Alloy Thin Films

How to Set Up Your STEM for EELS at Very High Energy Losses

Portable Electron Microscopy and Microanalysis in Extreme Environments

Near Shadowless EDS Tomography for Sliced Sample Realized by X-ray Collection with One Large Sized SDD Detector

Understanding EDXS Analysis of Nanostructures in TEM

Elemental Analyses of Heat Resistant Steels by High-Energy Resolution EDS Analyzer Based on Superconducting-Tunnel-Junction Array

The “Great VPSEM Gotcha”: Great VPSEM Imaging Does Not Imply Great VPSEM X-ray Microanalysis! Degraded Spatial Resolution Is Always Imposed by Gas Scattering

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Anniversary Session: Celebrating 50 Years of Microanalysis

Abstract