Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Anniversary Session: Celebrating 50 Years of Microanalysis

Abstract

Considerations for the Acquisition of Very Large Area EDS Spectral Image Mosaics

Progress in X-ray Mapping in Electron Microscopes Toward Single-Atom Analysis

Historical Development of the CAMECA EPMA

History of JEOL Microbeam Analysis: High Accuracy Analyses for Scientific and Industrial Work from the Centimeter to Nanometer Scale

EDAX - More Than 50 Years of Influence On Microanalysis

50 Years of Microanalysis: A Little History of Who’s Who, A Perspective from Bruker

The Magic That Turns a Tiny Cloud Of Electrons Into An X-Ray Spectrum

SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector

Advances in Atomic-resolution and Molecular-detection EELS

Quantitative Aspects of 3D Chemical Tomography in the Scanning Transmission Electron Microscope

The Many Connections Between Atom Probe and Electron Microscopy

Advances in (and a Brief History of) Cathodoluminescence Microscopy

Optimisation of Soft X-Ray Spectroscopy at Room and Liquid Nitrogen Temperatures

Integration of Quantitative Compositional Mapping and Image Processing Routines: A Powerful Approach to Petrologic Investigations

Analysis of Multi-Signal Hyperspectral Datasets Collected by EPMA

Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities

High Spatial Resolution Spectroscopy in a FE-SEM: X-ray Microanalysis and Electron Energy-Loss Spectroscopy

The f-ratio Quantification Method for X-ray Microanalysis with a Field Emission SEM Applied to Multi-Elements Specimen

Incorporation of an Amptek Silicon Drift Detector into a Wavelength Dispersive Spectrometer (WDS) Replacing the Gas Flow Proportional Counter

Characterizing the Effectiveness of Atomic Layer Deposited Coatings for the Prevention of Glass Disease

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Anniversary Session: Celebrating 50 Years of Microanalysis

Abstract