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Progress in X-ray Mapping in Electron Microscopes Toward Single-Atom Analysis

Published online by Cambridge University Press:  04 August 2017

M. Watanabe
M. Watanabe*
Affiliation:
Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1014 - 1015
Copyright
© Microscopy Society of America 2017 

References

[1] Goldstein, J.I., et al, Scanning Electron Microscopy and X-ray Microanalysis, 3rd Ed Plenum Press New York 2003.CrossRefGoogle Scholar
[2] Williams, D.B. & Carter, C.B. Transmission Electron Microscopy, 2nd ed Springer NY 2009.CrossRefGoogle Scholar
[3] Cosslett, V.E. & Duncumb, P. Nature 177 1956). p. 1172.CrossRefGoogle Scholar
[4] Dolby, R.M Proc. ICXOM3 1962. Academic Press 483 1963.Google Scholar
[5] Williams, D.B., et al, J. Electron Microscopy 51S, S113 2002.CrossRefGoogle Scholar
[6] Newbury, D.E., et al, Ultramicroscopy 78 1999). p. 73.CrossRefGoogle Scholar
[7] Lovejoy, T., et al, Appl.Phys. Lett. 100 2012). p. 154101.CrossRefGoogle Scholar
[8] Cliff, G. & Kenway, P.B. Proc. 47th Annual Meeting EMSA 1989). p. 200.Google Scholar
[9] Wittry, D.B. Electron Microscopy 3 1980). p. 14.Google Scholar
[10] The author wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229, and would like to thank to Dr. Peter Duncumb for providing useful information and reviewing this paper..Google Scholar