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Near Shadowless EDS Tomography for Sliced Sample Realized by X-ray Collection with One Large Sized SDD Detector

Published online by Cambridge University Press:  04 August 2017

Yoshitaka Aoyama
Affiliation:
JEOL Ltd., 1-2 Musashino 3-Chome Akishima Tokyo, Japan
Ichiro Ohnishi
Affiliation:
JEOL Ltd., 1-2 Musashino 3-Chome Akishima Tokyo, Japan
Eiji Okunishi
Affiliation:
JEOL Ltd., 1-2 Musashino 3-Chome Akishima Tokyo, Japan
Noriaki Endo
Affiliation:
JEOL Ltd., 1-2 Musashino 3-Chome Akishima Tokyo, Japan
Takeo Sasaki
Affiliation:
JEOL Ltd., 1-2 Musashino 3-Chome Akishima Tokyo, Japan
Yorinobu Iwasawa
Affiliation:
JEOL Ltd., 1-2 Musashino 3-Chome Akishima Tokyo, Japan
Yukihito Kondo
Affiliation:
JEOL Ltd., 1-2 Musashino 3-Chome Akishima Tokyo, Japan

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Mobus, G., etal, Ultramicroscopy 96 2003). p. 433.CrossRefGoogle Scholar
[2] Ohnishi, I., et al, Microsc. Microanal 22(3 2016). p. 318.Google Scholar