Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 18 of 48

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

Quantitative Strain Measurement in Sub-45 nm CMOS Transistors by Convergent Beam Electron Diffraction (CBED) at Low Temperature and Nano Beam Diffraction (NBD)
L Clement, D Delille
Published online by Cambridge University Press:

03 August 2008, pp. 386-387
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Local Strain Measurement by Geometrical Phase Analysis in the Transmission Electron Microscope Applied to Strain-Engineered CMOS Devices
J Chung, G Lian, C Vartuli, S Rajagopalan, L Rabenberg
Published online by Cambridge University Press:

03 August 2008, pp. 388-389
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

EFTEM- and STEM-EDXS Spectral Imaging of "Hidden" Si-based Semiconductor Device Defects
CT Schamp, BT Valdez
Published online by Cambridge University Press:

03 August 2008, pp. 390-391
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

EBIC Targeting for Dual Beam FIB Based TEM Sample Preparation
N Presser, B Foran, Y Sin, M Mason, SC Moss
Published online by Cambridge University Press:

03 August 2008, pp. 392-393
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Tunneling Magnetoresistance and B Diffusion in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions Characterized by STEM-EELS
JJ Cha, JC Read, RA Buhrman, DA Muller
Published online by Cambridge University Press:

03 August 2008, pp. 394-395
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Structural Analysis for Luminous Defects on GaN Epitaxial Layers
P Yongchoon, K Miyang, K Bae-Kyun
Published online by Cambridge University Press:

03 August 2008, pp. 396-397
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-situ probing the electrical, mechanical, and thermal properties of individual carbon nanotubes and nanowires by using a TEM-SPM platform
J-Y Huang
Published online by Cambridge University Press:

03 August 2008, pp. 398-399
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-Situ Characterization of 2D Potential Distributions in Biased Si n+-p Junctions Using Off-Axis Electron Holography
M Han, T Hirayama, DJ Smith, MR McCartney
Published online by Cambridge University Press:

03 August 2008, pp. 400-401
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

P-N Junction Observation in a Single Transistor Device by In-situ TEM Electrical Measurement
SY Park, D Cha, O Lourie, MJ Kim
Published online by Cambridge University Press:

03 August 2008, pp. 402-403
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Study of Epitaxial Germanium Quantum Dots in Silicon by Off-axis Electron Holography
L LI, MR McCartney, DJ Smith, S Ketharanathan, J Drucker
Published online by Cambridge University Press:

03 August 2008, pp. 404-405
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microstructural and Radial Distribution Function Analysis of Hydrogenated Silicon, Germanium, and Silicon-Germanium Alloy Thin Films
DB Saint John, NJ Podraza, BD Gauntt, J Li, EC Dickey
Published online by Cambridge University Press:

03 August 2008, pp. 406-407
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures Using Phase Retrieval High Resolution Transmission Electron Microscopy
K Mahalingam, HJ Haugan, GJ Brown, KG Eyink
Published online by Cambridge University Press:

03 August 2008, pp. 408-409
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

CNT-FET Schottky Barrier Devices Fabricated by E-beam Lithography
D Perello, MJ Kim, SY Jeong, BR Kang, DJ Bae, YH Lee, M Yun
Published online by Cambridge University Press:

03 August 2008, pp. 410-411
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

TEM Characterization of Nanoindentation in Nanoscale Metallic Multilayers
D Bhattacharyya, N Mara, P Dickerson, R Hoagland, A Misra
Published online by Cambridge University Press:

03 August 2008, pp. 412-413
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

TEM Correlation between the Structural and Optical Properties Of Rotationally Twinned InP Nanowires
DC Bell, J Bao, F Capasso, J Wagner, T Martensson, J Trägårdh, L Samuelson
Published online by Cambridge University Press:

03 August 2008, pp. 414-415
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterization of CNTs-Al dispersions using FE-TEM and FE-SEM
D Poirier, R Gauvin, RAL Drew
Published online by Cambridge University Press:

03 August 2008, pp. 416-417
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping Layers
JM LeBeau, JS Jur, DJ Lichtenwalner, AI Kingon, DO Klenov, S Stemmer
Published online by Cambridge University Press:

03 August 2008, pp. 418-419
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Energy Loss Spectroscopy Measurements of Amorphization of Polymorphs of TiO2 Induced by Ion Irradiation
NJ Zaluzec, KL Smith, GR Lumpkin, MG Blackford, KR Whittle
Published online by Cambridge University Press:

03 August 2008, pp. 420-421
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A TEM Study of Alkaline-Earth Metal Hexaboride Nanowires
S Li, S Amin, T Xu, VP Dravid
Published online by Cambridge University Press:

03 August 2008, pp. 422-423
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

4D STEM/EELS Characterization of Au Nanodots in a ZnO Thin Film
DN Leonard, K Jarausch, RD Twesten
Published online by Cambridge University Press:

03 August 2008, pp. 424-425
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 18 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

Quantitative Strain Measurement in Sub-45 nm CMOS Transistors by Convergent Beam Electron Diffraction (CBED) at Low Temperature and Nano Beam Diffraction (NBD)

Local Strain Measurement by Geometrical Phase Analysis in the Transmission Electron Microscope Applied to Strain-Engineered CMOS Devices

EFTEM- and STEM-EDXS Spectral Imaging of "Hidden" Si-based Semiconductor Device Defects

EBIC Targeting for Dual Beam FIB Based TEM Sample Preparation

Tunneling Magnetoresistance and B Diffusion in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions Characterized by STEM-EELS

Structural Analysis for Luminous Defects on GaN Epitaxial Layers

In-situ probing the electrical, mechanical, and thermal properties of individual carbon nanotubes and nanowires by using a TEM-SPM platform

In-Situ Characterization of 2D Potential Distributions in Biased Si n+-p Junctions Using Off-Axis Electron Holography

P-N Junction Observation in a Single Transistor Device by In-situ TEM Electrical Measurement

Study of Epitaxial Germanium Quantum Dots in Silicon by Off-axis Electron Holography

Microstructural and Radial Distribution Function Analysis of Hydrogenated Silicon, Germanium, and Silicon-Germanium Alloy Thin Films

Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures Using Phase Retrieval High Resolution Transmission Electron Microscopy

CNT-FET Schottky Barrier Devices Fabricated by E-beam Lithography

TEM Characterization of Nanoindentation in Nanoscale Metallic Multilayers

TEM Correlation between the Structural and Optical Properties Of Rotationally Twinned InP Nanowires

Characterization of CNTs-Al dispersions using FE-TEM and FE-SEM

Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping Layers

Electron Energy Loss Spectroscopy Measurements of Amorphization of Polymorphs of TiO2 Induced by Ion Irradiation

A TEM Study of Alkaline-Earth Metal Hexaboride Nanowires

4D STEM/EELS Characterization of Au Nanodots in a ZnO Thin Film

Microscopy and Microanalysis

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Volume 14 - August 2008

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article