Hostname: page-component-848d4c4894-mwx4w Total loading time: 0 Render date: 2024-06-22T11:45:12.042Z Has data issue: false hasContentIssue false
  • English
  • Français

EBIC Targeting for Dual Beam FIB Based TEM Sample Preparation

Published online by Cambridge University Press:  03 August 2008

N Presser ,
B Foran ,
Y Sin ,
M Mason  and
SC Moss
N Presser
Affiliation:
The Aerospace Corporation
B Foran
Affiliation:
The Aerospace Corporation
Y Sin
Affiliation:
The Aerospace Corporation
M Mason
Affiliation:
The Aerospace Corporation
SC Moss
Affiliation:
The Aerospace Corporation
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 392 - 393
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)