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4D STEM/EELS Characterization of Au Nanodots in a ZnO Thin Film

Published online by Cambridge University Press:  03 August 2008

DN Leonard ,
K Jarausch  and
RD Twesten
DN Leonard
Affiliation:
Appalachian State University
K Jarausch
Affiliation:
Hitachi High Technologies America,Inc
RD Twesten
Affiliation:
Gatan Inc
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 424 - 425
Copyright
© 2008 Microscopy Society of America

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