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Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures Using Phase Retrieval High Resolution Transmission Electron Microscopy

  • K Mahalingam (a1), HJ Haugan (a1), GJ Brown (a1) and KG Eyink (a1)

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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures Using Phase Retrieval High Resolution Transmission Electron Microscopy

  • K Mahalingam (a1), HJ Haugan (a1), GJ Brown (a1) and KG Eyink (a1)

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