Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 1
Sensitivity and Figure of Merit Measurements of EELS vs XEDS in the Analytical Electron Microscope
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 1518-1521
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3D Microstructure Characterization of a Silicon Based Anode Material on Different Length Scales suitable for Storage Applications
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 356-357
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Advantages of HAADF vs. Conventional TEM Imaging for Study of PSS-PMB Diblock Copolymer Systems
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 1698-1699
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Understanding Microstructural Changes in Metals Induced by Gallium Ion Beam Irradiation
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 884-885
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Surface Analysis of Polymers using Helium Ion Microscopy Coupled with Secondary Ion Mass Spectrometry (HIM-SIMS)
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 868-869
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Understanding the Ordering of Charged Nanoparticles in Water
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- 05 August 2019, pp. 2096-2097
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Ultrastructure of Human Pancreatic Cancer Cells Treated with a TBK1 Inhibitor
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- 05 August 2019, pp. 1284-1285
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Improving Resolution of HAADF STEM Images with Maximum Entropy Method and Deconvolution Processing
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- 01 August 2005, pp. 1476-1477
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Virtual Electron Backscatter Diffraction for Multiscale Defect Characterization
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- 30 July 2021, pp. 1458-1459
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Comparison of the Swelling of Treated and Untreated Hair Using an Environmental Electron Microscope (ESEM)
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- 31 July 2006, pp. 1484-1485
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Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't
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- 30 July 2020, pp. 442-443
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Engineering Chiral Structures Through Strain Release: Electron Tomography Study of Twisted Nanowires
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- 05 August 2019, pp. 1804-1805
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Deep Learning for Lensless Compressive Imaging
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 506-507
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Strain Characterization of Advanced CMOS Transistors: An Industry Perspective
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 974-975
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Time Resolved SEM-SXES Analysis for Lithium Material
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- 30 July 2020, pp. 68-70
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The Dual Challenges for FIBXTEM in the Era of sub-50nm Feature Sizes
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 314-315
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Absolute Configuration, Optical Activity and Raman Microscopy of L and D-Glutamic Acid
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 1382-1383
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Energy Filtered STEM Imaging at 30kV and Below - A New Window into the Nano-World?
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- 04 August 2017, pp. 1560-1561
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Effect of thermochemical treatments on the surface hardening of a circular saw blade: A microstructure comparison of nitride layers, boride layers and TiN coating formed on ASTM A1011 steel
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 2372-2374
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TEM Imaging of Edges and Point Defects in Monolayer Phosphorene
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 2348-2350
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