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Surface Analysis of Polymers using Helium Ion Microscopy Coupled with Secondary Ion Mass Spectrometry (HIM-SIMS)

Published online by Cambridge University Press:  05 August 2019

Artem A. Trofimov ,
Matthias Lorenz ,
Anton Ievlev ,
Stephen T. King ,
Olga S. Ovchinnikova  and
Alex Belianinov
Artem A. Trofimov
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Matthias Lorenz
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Anton Ievlev
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Stephen T. King
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Olga S. Ovchinnikova
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Alex Belianinov*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
*
*Corresponding author: belianinova@ornl.gov

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 868 - 869
Copyright
Copyright © Microscopy Society of America 2019 

References

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[2]Beamson, FR and Briggs, D, Surface and Interface Analysis 17 (1991), pp. 842-846.Google Scholar
[3]Lianos, L, Quet, C, and Duc, TM, Surface and Interface Analysis 21 (1994), pp. 14-22.Google Scholar
[4]Hlawacek, G and Gölzhäuser eds, A. “Helium Ion Microscopy.” (Cham: Springer).Google Scholar
[5]Borodinov, N et al. , Nanoscale 10 (2018), pp. 18001-18009.Google Scholar
[6]Dowsett, D and Wirtz, T, Analytical Chemistry 89 (2017), pp. 8957-8965.Google Scholar
[7]This research was supported by ExxonMobil Corporation and conducted at the Center for Nanophase Materials Sciences (CNMS), which is a DOE Office of Science User Facility. The authors acknowledge Drs. D. Abmayr, W. Lamberti, R. Colby, and S. Yakovlev from ExxonMobil Chemical Corporation for providing polymer samples and useful discussion.Google Scholar