Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 2
Advances in High-Speed EBSD Orientation Mapping
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- Published online by Cambridge University Press:
- 05 August 2007, pp. 924-925
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- Cited by 2
Atom Scale Characterization of the Near Apex Region of an Atomic Force Microscope Tip
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- Published online by Cambridge University Press:
- 30 July 2010, pp. 636-642
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- Cited by 2
Effects of Pamidronate on Dental Enamel Formation Assessed by Light Microscopy, Energy-Dispersive X-Ray Analysis, Scanning Electron Microscopy, and Microhardness Testing
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- Published online by Cambridge University Press:
- 23 May 2016, pp. 640-648
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- Cited by 2
Microscopy of Polyurea Grease
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- Published online by Cambridge University Press:
- 23 December 2020, pp. 12-19
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Workflow Automation and Portability Enable High Throughput Image Processing and Segmentation for Cell Biology Systems
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 1388-1389
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- Cited by 2
3d Reconstruction of Sub-Nm Beam Profiles in STEM
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- 02 July 2020, pp. 344-345
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Imaging Low Z Materials in Crystalline Environments Via Scanning Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 1732-1733
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- Cited by 2
AFM Nanoindentation of Polymers
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- 05 August 2007, pp. 186-187
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A Comparison of Atomic Force Microscopy and Field-Emission Scanning Electron Microscopy for Imaging the Plant Cell Wall
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 1130-1131
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In Situ Determination of Local Ce Oxidation States During Redox Reactions
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- 01 August 2002, pp. 600-601
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Physical and electrical characterization of the interface between atomic-layer-deposited Al2O3 on GaAs substrates for CMOS applications
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- Published online by Cambridge University Press:
- 03 August 2008, pp. 446-447
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- Cited by 2
FIB Dimpling: A Method for Preparing Plan-View TEM Specimens
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- 02 July 2020, pp. 506-507
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- Cited by 2
Ultrastructure of a Clinical Isolate of Staphylococcus Aureus Small Colony Variant and its Revertant
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 982-983
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Improve X-ray Microanalysis in Variable-Pressure SEMs with Polycapillary X-ray Optics
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 402-403
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Surface Modification of a-C:H(N) Thin Films by Plasma Treatment
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- Published online by Cambridge University Press:
- 30 December 2005, pp. 162-165
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Sub-Angstrom Probe Size in HADF-STEM at 120KV
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- Published online by Cambridge University Press:
- 01 November 2002, pp. 14-15
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A Solution to the Problem of X-Ray Mapping Samples with Surface Roughness
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- 26 July 2009, pp. 530-531
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Precipitation of (Si2−xAlx)Hf in an Al–Si–Mg–Hf Alloy
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- Published online by Cambridge University Press:
- 20 June 2017, pp. 724-729
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Extraction Replication of Carbides and Borides in the Ni-base Superalloy IN100
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- 01 August 2004, pp. 692-693
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A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in Transmission
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- Published online by Cambridge University Press:
- 05 December 2018, pp. 634-646
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