Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 2
Automated, Programmable Processing of Specimens and Grids with the mPrep™ ASP-1000
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 11-12
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- Cited by 2
Functional Architecture of the Retromer Cargo-recognition Complex
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- Published online by Cambridge University Press:
- 03 August 2008, pp. 1568-1569
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- Cited by 2
Immunolocalization of PPP1C Isoforms in SH-SY5Y Cells During the Cell Cycle
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- Published online by Cambridge University Press:
- 28 September 2012, pp. 41-42
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- Cited by 2
Self Pressure Freezing of Caulobacter crescentus for the Preparation of Frozen Hydrated Sections
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 860-861
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Combinatorial RF Magnetron Sputtering for Rapid Materials Discovery: Methodology and Applications
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- Published online by Cambridge University Press:
- 01 August 2004, pp. 58-59
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- Cited by 2
Fringe Visibility Maps
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 272-273
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The Dragonfly Macro Engine for Executing Recorded Tasks in Image Processing and Visualization
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 246-247
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Determination of the Modal Abundance of Nano-Scale Amorphous Phases Using Selected Area Electron Diffraction Mapping
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 1786-1787
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Energy Dispersive Spectrometry at Wavelength Precision
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 556-557
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Image Simulation and Analysis to Predict the Sensitivity Performance of a Multi-Electron Beam Wafer Defect Inspection Tool
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 620-621
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- Cited by 2
Multiple Ion Plasma FIB Application for Editing Laser Chips to Enable Live Monitoring of the Semiconductor Material Failure.
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- Published online by Cambridge University Press:
- 22 July 2022, pp. 84-85
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How Can One Choose the Best Method for Measuring FRET in a Microscope with My Biological System?
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 272-273
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- Cited by 2
Advances in Scanning Transmission Electron Microscope Cathodoluminescence
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 1687-1688
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Stable Continuously Variable Temperature Cryo-STEM to Understand the Structurally Driven Phase Transition in the 2D Layered Magnet Nb3Br8
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 1090-1092
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EBSD at High Temperatures in Metals and Minerals
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- Published online by Cambridge University Press:
- 06 August 2003, pp. 78-79
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Quantification of Nanoparticles in Dispersions Using Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 11 May 2021, pp. 557-565
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Dynamical Diffraction Calculations of Incommensurate Modulations in Crystals
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 1928-1929
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Atomic and Electronic Structures of Functionalized Nanodiamond Particles
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- 04 August 2017, pp. 2270-2271
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Simulation for the Development of Electron Guns and Detection Systems of Modern Field Emission Scanning Electron Microscopes
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- Published online by Cambridge University Press:
- 28 September 2015, pp. 200-205
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Structure-Property Investigations via SEM In-Situ Micromechanical Testing
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 1466-1467
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