Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Strain Analysis from Nano- to Micro-length Scales

Abstract

High Angular Resolution Electron Backscatter Diffraction Studies of Tetragonality in Fe-C Martensitic Steels

Local Strain Analysis using Scanning Nanobeam Electron Diffraction during In Situ TEM Nanomechanical Testing

Developing High Resolution and High Precision Strain Mapping Methodologies for Materials Research and Semiconductor Technology

Residual Stress Characterization on the Mesoscale in Additive Manufacturing

Nano-scale Elastic Strain Maps of Twins in Magnesium Alloys

Probing Nanoscale Local Lattice Strains in Semiconductor Nanostructures and Devices by Transmission Electron Microscopy

Strain Characterization of Advanced CMOS Transistors: An Industry Perspective

Dynamical Effects on the Geometric Phase

Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy

Strain Analysis in Polycrystalline Diamond under Extreme Conditions

Coherency and Thermal Evolution of Metastable and Stable P Phase Precipitates in Aluminum Alloy AA5456

Sterling Newberry Memorial Symposium on X-ray Imaging

Abstract

The Munich Compact Light Source: Biomedical Research At a Laboratory-Scale Inverse-Compton Synchrotron X-ray Source

Micro-Focused Five Dimensional X-ray Imaging with the Color X-ray Camera

A New Method for Characterizing 3D Microstructures Using Lab-based Diffraction Contrast Tomography

X-ray Detectors - in Heaven and on Earth

Combining 3D X-ray Techniques; Computed Tomography and Fluorescence

Blob-based Algebraic Reconstruction Technique for Computed Laminography

Next Generation of Instruments Required - Not just X-Ray Imaging but Combined EDS, CL, GSR, XRM, XRD and Raman Systems

In situ Dynamic X-ray Tomography in the Laboratory

Soft X-ray Microscopy: History, Status, and Future

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Strain Analysis from Nano- to Micro-length Scales

Abstract

Sterling Newberry Memorial Symposium on X-ray Imaging

Abstract