Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The FIB-SEM Laboratory: Sample Preparation and Beyond

Abstract

A Method for Plan-View FIB Liftout of Near Surface Defects with Minimal Beam-Induced Damage

A Unique Approach for Preparing Cross-Sectional EM Study of Textile Fibers

The NanoWorkstation: Complementing FIB-SEM Tools with Micromanipulators

Characterization of the CIGS Solar Cell System in the FIB-SEM Laboratory

NanoFab with SIMS - Recent Results from the BAM-L200 Analytical Standard and Semiconductor Samples

Technical Refinement of the Orage Ga-FIB column and Optimizing its Control for Routine Analytical Tasks

Automatic End-point Detection for Ar+ Milling of FIB in situ and ex situ Lift-out Specimens from Semiconductor Devices

Coloring with Focused Ion Beam Fabricated Nanostructures

Investigation of slice thickness for FIB tomography in a plasma focused ion beam system

Preparation of Sharp Tip Samples Using a Tescan GAIA3 FIB-SEM System

Low-Energy Argon Broad Ion Beam and Narrow Ion Beam Milling of In Situ Lift-Out FIB Specimens

Pushing the Limits of Cryo-EM

Abstract

Advanced Data Acquisition From Electron Microscopes With SerialEM

A Complete Workflow for Cellular Tomography and Subtomogram Averaging in EMAN2

Algorithmic Advances in Single Particle Cryo-EM Data Processing

To Cryo-Cycle or Not to Cryo-Cycle; That is the Question!

CryoET of Single Particle CryoEM Grids Reveals Widespread Particle Adsorption to the Air-Water Interface, Which May be Reduced with New Plunging Techniques

Zooming in on Cell Architecture and Molecular Structures with Correlative Light and Electron Microscopy

Cryo-STEM Imaging of Ribosomes Using the Electron Microscope Pixel Array Detector

The Potential for Greater Clarity Cryo-Electron Microscopy via Ptychography

Determining and Controlling the Surface Properties of Cryo-EM Specimen Supports

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The FIB-SEM Laboratory: Sample Preparation and Beyond

Abstract

Pushing the Limits of Cryo-EM

Abstract