Hostname: page-component-848d4c4894-tn8tq Total loading time: 0 Render date: 2024-06-27T15:53:05.561Z Has data issue: false hasContentIssue false
  • English
  • Français

Low-Energy Argon Broad Ion Beam and Narrow Ion Beam Milling of In Situ Lift-Out FIB Specimens

Published online by Cambridge University Press:  01 August 2018

M.J. Campin ,
C.S. Bonifacio  and
P.E. Fischione
M.J. Campin
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
C.S. Bonifacio
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
P.E. Fischione
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 862 - 863
Copyright
© Microscopy Society of America 2018 

References

[1] Giannuzzi, LA Stevie, FA Micron 30 1999) p. 197.Google Scholar
[2] Mayer, J, et al., MRS Bulletin 30 2007) p. 400.Google Scholar
[3] Kelley, R, et al., Microscopy and Microanalysis 19(Suppl 2 2013) p. 862.Google Scholar
[4] Giannuzzi, LA, et al., Microscopy and Microanalysis 11(Suppl. 2 2005) p. 828.Google Scholar
[5] Schaffer, M, et al., Ultramicroscopy 114 2012) p. 62.Google Scholar
[6] Mitome, M Journal of Electron Microscopy 62(2 2013) p. 321.Google Scholar
[7] Nowakowski, P, et al., Microscopy and Microanalysis 23(Suppl. 2 2017) p. 300.Google Scholar