Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis

Abstract

Multidimensional Analysis of Nanoscale Phase Separation in Complex Materials Systems

Improved Data Analysis and Reconstruction Methods for STEM-EDX Tomography

Quantifying the Advantages of Compressive Sensing and Sparse Reconstruction for Scanning Transmission Electron Microscopy

High Performance Computing Tools for Cross Correlation of Multi-Dimensional Data Sets Across Instrument Platforms

The Enabler Framework: an Object-Oriented Toolkit for Microscopy Data Analysis

Using Multivariate Analysis of Scanning-Rochigram Data to Reveal Material Functionality

Plasmons in Mesoscopic Gold Tapers

Temperature Dependence of the Volume Plasmon in Silicon Nanoparticles

Hyperspectral Imaging of Surface-Plasmon-Enhanced Local Electric Fields by EELS with Tunable <60meV Energy Resolution

Unveiling Nanometric Plasmons Optical Properties With Advanced Electron Spectroscopy in the Scanning Transmission Electron Microscope

Strategies for Obtaining High Spatial Resolution in Imaging and Spectroscopy of Beam-sensitive TEM Specimens

Quantitative Annular Dark-Field Imaging at Atomic Resolution

Integrated Differential Phase Contrast (iDPC) STEM: A New Atomic Resolution STEM Technique To Image All Elements Across the Periodic Table

Linking Dopant Distribution and Interatomic Distortions at La1.6Mo.4CuO4/La2CuO4 Superconducting Interfaces

Improvement of Imaging Performance with a New ASCOR Probe-Corrector in a 200 kV JEM-ARM200CF

Initial Results From a CdTe High-Energy X-ray Detector on a TEM

Atomic-resolution EELS Study of Polarization of BaTiO3in the Interface With Metallic Manganite

Effective Method for Decreasing Detection Limit of Dopant Concentration in Semiconductor Using Dual SDD Analysis System

Ultrahighly Efficient X-ray Detection System Of Two Very Large Sized SDDs for Aberration Corrected 300 kV Microscope

Study of Strain and Intermixing at the BaSnO3/SrTiO3and BaSnO3/LaAlO3Interfaces Using STEM and EELS

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis

Abstract