Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Surface and Subsurface Microscopy and Analysis

Abstract

High Reproducible Scanning Near-field Optical Microscopy with a Few Nanometer Lateral Spatial Resolution

Electronic Behaviors of Individual Defects and Boundaries in 2D Materials: A Spatially Resolved Study with Multi-Probe Scanning Tunneling Microscopy

Surface Phonon Coupling within Boron Nitride Nanotubes Resolved by a Novel Near-Field Infrared Pump-Probe Imaging Technique.

Submicron Spatial Resolution in Thermal Desorption Mass Spectrometry via Rapid Heating Functions using Thermal AFM Probes

Making Light Work: Enhancing Surface and Thin Film Analysis through In-Situ Complementary Spectroscopies

High Speed, Large Scan Area, Distortion Free Operation of a Single-Chip Scanning Probe Microscope

Innovative Applications of Raman Microscopy

Full information acquisition and analysis of reflection high energy electron diffraction data for epitaxial growth processes

Field Ion Microscopy and Pulsed Field Desorption Mass Spectrometry: Unique Tools for Surface and Subsurface Analysis

XPS Spectromicroscopy as an Optimised Technique for Materials Characterisation.

Observation of Moiré-like Fringes in HAADF-STEM Images of Heterostructures of Two-dimensional Materials

Differentiation of Surface and Bulk Conductivities via Four-probe Spectroscopy

Atomistic Exploration of the Surface-Sensitive Oriented Attachment Growth of a-MnCh Nanowires and the Formation of Defective Interface with 2×3 and 2×4 Tunnel Intergrowth

Correlating Substrate Properties with Pressure Sensitive Adhesive Performance

Utilizing Scanning Probe Microscopy to Investigate Preferential Conductive Paths through Polycrystalline BaTiO3Dielectric Layer of MLCCs

Scanning Electron Microscopy Study of the Activation of Porous Stainless Steel for Pd Electroless Plating

Analysis of Thin Phase-Shifter Films using Surface Analysis Techniques

Quantitative and Qualitative Microanalysis by EPMA and SEM

Abstract

Rigorous Quantitative SEM/EDS Microanalysis Requires Careful Inspection of the Peak-Fitting Residual Spectrum to Reveal Hidden Constituents

Uncertainty Is Our Friend-Rethinking Microanalysis Around Uncertainty Metrics

X-ray Emission From Thin Films on a Substrate - Experiments and Simulation

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Surface and Subsurface Microscopy and Analysis

Abstract

Quantitative and Qualitative Microanalysis by EPMA and SEM

Abstract