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Submicron Spatial Resolution in Thermal Desorption Mass Spectrometry via Rapid Heating Functions using Thermal AFM Probes

Published online by Cambridge University Press:  25 July 2016

Suhas Somnath
Affiliation:
The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Stephen Jesse
Affiliation:
The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Gary J. Van Berkel
Affiliation:
Mass Spectrometry and Laser Spectroscopy Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Sergei V. Kalinin
Affiliation:
The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Olga S. Ovchinnikova
Affiliation:
Mass Spectrometry and Laser Spectroscopy Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Ovchinnikova, O. S., et al., ACS Nano 9 (2015). p. 42604269.CrossRefGoogle Scholar
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[4] Usmanov, D. T., et al., Journal of The American Society for Mass Spectrometry 24 (2013). p. 17271735.CrossRefGoogle Scholar