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Full information acquisition and analysis of reflection high energy electron diffraction data for epitaxial growth processes

  • R. K. Vasudevan (a1) (a2), A. G. Gianfrancesco (a1) (a2), A. P. Baddorf (a1) (a2) and S. V. Kalinin (a1) (a2)
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References

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[1] Vasudevan, RK, Tselev, A, Baddorf, AP & Kalinin, SV ACS Nano 26 (2015). p. 10899.
[2] Marshall, MSJ & Castell, MR Chemical Society Reviews 43 (2014). p. 2226.
[3] Tselev, A, Vasudevan, RK, Gianfrancesco, AG, Liang, Q, Ganesh, P, Meyer, TL, Lee, HN, Biegalski, MD, Baddorf, AP & Kalinin, SV ACS Nano 9 (2015). p. 4316.
[4] This research was sponsored by the Division of Materials Sciences and Engineering, BES, DOE (RKV, SVK). Research was conducted at the Center for Nanophase Materials Sciences, which also provided support (APB) and is a DOE Office of Science User Facility.

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