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Ultrahighly Efficient X-ray Detection System Of Two Very Large Sized SDDs for Aberration Corrected 300 kV Microscope

Published online by Cambridge University Press:  25 July 2016

Ichiro Ohnishi ,
Kouji Miyatake ,
Yu Jimbo ,
Yorinobu Iwasawa ,
Masaki Morita ,
Takeo Sasaki ,
Hidetaka Sawada  and
Eiji Okunishi
Ichiro Ohnishi
Affiliation:
JEOL Ltd., EM Business Unit, 3-1-2 Musashino, Akishima, Tokyo, Japan
Kouji Miyatake
Affiliation:
JEOL Ltd., EM Business Unit, 3-1-2 Musashino, Akishima, Tokyo, Japan
Yu Jimbo
Affiliation:
JEOL Ltd., EM Business Unit, 3-1-2 Musashino, Akishima, Tokyo, Japan
Yorinobu Iwasawa
Affiliation:
JEOL Ltd., EM Business Unit, 3-1-2 Musashino, Akishima, Tokyo, Japan
Masaki Morita
Affiliation:
JEOL Ltd., EM Business Unit, 3-1-2 Musashino, Akishima, Tokyo, Japan
Takeo Sasaki
Affiliation:
JEOL Ltd., EM Business Unit, 3-1-2 Musashino, Akishima, Tokyo, Japan
Hidetaka Sawada
Affiliation:
JEOL Ltd., EM Business Unit, 3-1-2 Musashino, Akishima, Tokyo, Japan
Eiji Okunishi
Affiliation:
JEOL Ltd., EM Business Unit, 3-1-2 Musashino, Akishima, Tokyo, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 318 - 319
Copyright
© Microscopy Society of America 2016 

References

[1] Sasaki, T., et al, Micros. Microanal 21(Suppl. 3 (2015). p. 1861–1867.CrossRefGoogle Scholar
[2] Watanabe, M., et al, Micros. Microanal 21(Suppl. 3 (2015). p. 1223–1224.CrossRefGoogle Scholar