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Hyperspectral Imaging of Surface-Plasmon-Enhanced Local Electric Fields by EELS with Tunable <60meV Energy Resolution

Published online by Cambridge University Press:  25 July 2016

Patricia Abellan ,
Patrick Z. El-Khoury ,
Fredrik S. Hage ,
Josh Cottom ,
Alan G. Joly ,
Wayne P. Hess ,
Rik Brydson  and
Quentin M. Ramasse
Patricia Abellan
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, U.K
Patrick Z. El-Khoury
Affiliation:
Physical Sciences Division, Pacific Northwest National Laboratory, Richland, U.S.A.
Fredrik S. Hage
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, U.K
Josh Cottom
Affiliation:
Institute for Mater. Research, School of Chem. and Process Eng., University of Leeds, Leeds, U.K.
Alan G. Joly
Affiliation:
Physical Sciences Division, Pacific Northwest National Laboratory, Richland, U.S.A.
Wayne P. Hess
Affiliation:
Physical Sciences Division, Pacific Northwest National Laboratory, Richland, U.S.A.
Rik Brydson
Affiliation:
Institute for Mater. Research, School of Chem. and Process Eng., University of Leeds, Leeds, U.K.
Quentin M. Ramasse
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, U.K

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 298 - 299
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Nelayah, J., et al., Nature Physics (2007) 3, 348–353.CrossRefGoogle Scholar
[2] Bosman, M., et al., Scientific reports (2013) 3.CrossRefGoogle Scholar
[3] Egerton, R. F. in “Electron Energy-Loss Spectroscopy in the Electron Microscope”. Springer, (New York), 3rd Ed (2011).CrossRefGoogle Scholar
[4] Bellido, E. P., et al., Microsc. Microanal., 2014, 20, 767; V. Keast and M. Bosman, Microscopy research and technique, 2007, 70, 211; S. Lazar et al., Ultramicroscopy, 2006, 106, 1091.Google Scholar
[5] Krivanek, O. L., et al., Nature (2014) 514, 209–212.CrossRefGoogle Scholar
[6] SuperSTEM is the UK EPSRC National Facility for Aberration-Corrected STEM, supported by the Engineering and Physical Science Research Council. PZE acknowledges support from the Laboratory Directed Research and Development Program at Pacific Northwest National Laboratory. WPH is supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, Division of Chemical Sciences, Geosciences & Biosciences.Google Scholar