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Proceedings of Microscopy & Microanalysis 2016

Volume 22 - Supplement S3 - July 2016

Page 52 of 53


Physical Science Symposia

Microscopy and Analysis in Forensic Science

Abstract

Technologist Forum, Tutorials and Outreach Symposia

Technologists’ Forum - Real Analysis Data Vs Artifact Recognition

Abstract

Technologists’ Forum - Special Topic: A Practical Approach to Current Software Solutions and Their Applications

Abstract

Technologists’ Forum - Roundtable Discussion on Artifacts

Abstract

Career Tracks in Government and Industry

Abstract

Effective Tactics for Getting an Equipment Grant

Abstract

Building and Validating Atomic Models for EM Density Maps

Abstract

Diffraction Mapping and 4D STEM

Abstract

Compressive Sensing Applications in Microscopy

Abstract


Page 52 of 53