Artifacts In Cryo Preparation for Electron Microscopy

Kim Rensing

doi:10.1017/S1431927616011144

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Artifacts In Cryo Preparation for Electron Microscopy

Published online by Cambridge University Press: 25 July 2016

Kim Rensing

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Kim Rensing*: Affiliation:
Fibics Inc. Ottawa, ON, Canada

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 2060 - 2061

DOI: https://doi.org/10.1017/S1431927616011144 [Opens in a new window]
Copyright: © Microscopy Society of America 2016

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Artifacts In Cryo Preparation for Electron Microscopy

Volume 22, Supplement S3
Kim Rensing ^(a1)
DOI: https://doi.org/10.1017/S1431927616011144

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Artifacts In Cryo Preparation for Electron Microscopy

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