Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Cross-Cutting Symposia

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis

Automation of Supported Nanoparticle Recognition in Low Contrast STEM Images

Development of a Flexible Ensemble Classification System for Microscopy

Electron Image Reconstruction for Pixelated Semiconductor Tracking Detectors Based on Neural Networks

Euclid-NexusLIMS: A Customizable Data Management Software for Microscopists with Cloud Computing Outlook

Synthetic Data for Machine Learning and Novel Edge Detection to Measure Particle Size Distributions in TEM

Understanding the Role of Neural Network Complexity and Receptive Field in Identifying Nanoparticles in TEM Images

4D-STEM Analysis with the Open Source py4DSTEM and crystal4D Toolkits

Strain Mapping from Electron Diffraction Patterns using a Fourier-space Complex Neural Network

Lossless Image Compression for 4D-STEM Datasets

Automated Acquisition and Deep Learning of 2D Materials on the Million-Atom Scale

A Comparison of 3D and 2D U-Net Convolutional Networks for Segmentation in FIB-SEM Imagery

Automatic Nondestructive Detection of Damages in Thermal Barrier Coatings Using Image Processing and Machine Learning

Data Analytics: Quality Measures for Image Information Content

Fast Automatic Point Spread Function Deconvolution Using Edge Detection

Finding Features from Microscopes to Simulations Via Ensemble Learning and Atomic Manipulation

Software Package for Efficient Creation of Training Data for Machine Learning Classifiers from Micrographs

Automated Design of Electron Mirrors for Multipass Electron Microscopy and 4D-STEM+EELS

Machine Learning Prediction of Valence and Coordination from EELS Spectra of Iron Containing Compounds

Traceable Measurements using a Metrology Scanning Electron Microscope

High Throughput 3D Volumes Data Acquisition Using AI

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Cross-Cutting Symposia

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis