Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Cross-Cutting Symposia

Facilities Management Crucial Skills and Strategies

The National Center for CryoEM Access and Training: Broadening Access to CryoEM Through Centralized Facilities

On Demand - Facilities Management Crucial Skills and Strategies

Establishment and Maintenance the Interactive, Collaborative, and Research Driven Microscopy Laboratory

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis

How to Get Something Out of Nothing (Almost!): Extracting Information from Noisy Data

Physics-Guided Machine Learning for the Analysis of Low SNR STEM-EDXS Data

Simulation-Trained Machine Learning Models for Lorentz Microscopy

Large-scale Automated Analysis of High-Resolution Transmission Electron Microscopy Data Assisted by Deep Learning Neural Networks

Doing More with Less: Artificial Intelligence Guided Analytics for Electron Microscopy Applications

A High-throughput Electron Microscopy Workflow and its Applications in Life Sciences

Approaches Taken to Streamline and Consolidate Large Dataset Processing Techniques, with a Focus on Ptychography

Automation of TEM Alignment using Python Scripting

Classification of Metal Nanoclusters Using Convolutional Neural Networks

Exploring Motifs and Their Hierarchies in Crystals via Unsupervised Learning

Phase-residue Removal Based on Sparse Modeling in Electron Holography

Quantifying Differences Between Machine Learning Classification Models Applied to Cancer Microscopy Data

Artificial Neural Network for Automatic Alignment of Electron Optical Devices

Compressive Hyperspectral Microscopy of Plasmonic Nanoparticles – Noise Characteristics and Performance Limits

Deep Learning Computer Vision for Anomaly Detection in Scanning Transmission Electron Microscopy

Versatile Automated Domain Mapping of 4D-STEM Data Utilizing ML Algorithms and Bayesian Statistics

Convolutional Neural Network as a Solution to Segment and Classify High Resolution TEM Images to Obtain 3D Information

A Semi-Supervised Machine Learning Workflow to Extract Quantitative Insights From Ultrafast Electron Microscopy Datasets

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Cross-Cutting Symposia

Facilities Management Crucial Skills and Strategies

On Demand - Facilities Management Crucial Skills and Strategies

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis