Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Cross-Cutting Symposia

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis

Infrastructure for Analysis of Large Microscopy and Microanalysis Data Sets

Synthetic Data Curation Strategies for Robust Model Development: A Case Study with HRTEM Micrograph Segmentation

Intelligent and Automatic Parameter Optimization for High-resolution Electron Ptychography

Efficient Memory Storage and Linear Parallel Scaling for Large-Scale Electron Ptychography

Automatic and Quantitative Measurement of Spectrometer Aberrations in Monochromated EELS

Exploiting Automatic Image Processing and In-situ Transmission Electron Microscopy to Understand the Stability of Supported Nanoparticles

Python and FPGA-based Workflow for Automated and Interoperable Scanning Probe Microscopy

Compressed STEM Simulations

Application of Deep Unsupervised Convolutional Neural Networks to Denoise Large Temporally Resolved In Situ TEM Datasets

Nanoparticle Localization Using Gabor Filters

Maximizing Neural Net Generalizability and Transfer Learning Success for Transmission Electron Microscopy Image Analysis in the Face of Small Experimental Datasets

Tomviz: An Open-Source Platform for Electron Tomography

Exploring Local Crystal Symmetry with Rotationally Invariant Variational Autoencoders

Gated Dense Convolutional Neural Networks for Unbalanced Representations in STEM Tomography

On Demand - Artificial Intelligence, Instrument Automation, and High-Dimensional Data Analytics for Microscopy and Microanalysis

Machine Learning Enabled Reproducible Data Analysis for Electron Microscopy

Autonomous Electron Microscopy Enabling Physics Discovery: Applications in Plasmonics of 2D Systems

Bayesian Optimization for Multi-dimensional Alignment: Tuning Aberration Correctors and Ptychographic Reconstructions

Biotherapeutics Evaluation Using Artificial Intelligence Assisted Image Analysis

Comparison Between Deep Learning and Iterative Bayesian Statistics Deconvolution Methods in Energy Electron Loss Spectroscopy

Diagnostic and Correction of Phase Aberrations in Scanning Transmission Microscopy by Artificial Neural Networks

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Cross-Cutting Symposia

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis

On Demand - Artificial Intelligence, Instrument Automation, and High-Dimensional Data Analytics for Microscopy and Microanalysis