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Electron Image Reconstruction for Pixelated Semiconductor Tracking Detectors Based on Neural Networks
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Ronneberger, O. et al. , U-net: Convolutional networks for biomedical image segmentation, Springer, International Conference on Medical image computing and computer-assisted intervention, p. 234-241 (2015)CrossRefGoogle Scholar
Eckert, B. et al. , Electron Imaging Reconstruction for Pixelated Semiconductor Tracking Detectors Using the Approach of Convolutional Neural Networks, submitted to IEEE, Transaction on Nuclear Science (2021)CrossRefGoogle Scholar
International Organization for Standardization, Photography - Electronic Still Picture Imaging-Resolution and Spatial Frequency Responses, ISO 12233:2017, ISO (2017)Google Scholar