Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

Expanding the Limits of Atom Probe Tomography

Origin of High-Density Zone Lines in Field Desorption Patterns of Tungsten

Simultaneous Voltage and Laser Pulsing in Atom Probe Tomography

Structural Change of MgNiY Long Period Stacking Order Investigated with Atom Probe

Dynamic observation of electro-assisted Fe oxidation by Operando Atom Probe

Fully Automated Data Acquisition and Reporting for Semiconductor Dopant Analysis

A Standards-based Approach to Dopant Quantification Using Atom Probe Tomography

AP Suite Extension Infrastructure

APT_PyControl, an Open-source Python Atom Probe Tomography Control Software Package

3D-Atomic-Scale Analysis of Magnetoelectric Multiferroic Topologies via Scanning Transmission Electron Microscopy and Spectroscopy Complemented by Atom Probe Tomography

Nanoscale Spatial and Chemical Exploration of Porcine Trabeculae Bone using Atom Probe Tomography

Atom Probe Tomography of Catalyst Nanoparticles

Carbon Capping for Specimen Preparation of Atom Probe Samples with Features of Interest Near the Surface

The Effect of ω- and α-Phase Precipitation on the β-Phase Lattice Parameters During 400°C aging in Ti-11Cr(at.%)

On Demand - Expanding the Limits of Atom Probe Tomography

Are vacancies in field ion microscopy artefacts? A DFT study

Expanding the Limits of Atom Probe Crystallographic Analysis

Quantifying Lithium in Lithium-ion battery solid electrolyte by atom probe tomography correlated with high-resolution scanning electron microscopy

Science of Metrology with Electrons

Imaging the Electronic Structure of Strained Epitaxial Monolayer Graphene

Imaging Atomically Thin Transition Metal Dichalcogenides Using Deep Ultraviolet Photoelectron Emission Microscopy

Metrology of Sample Preparation for Electron Microscopy: Application to Strain Measurements

The Reproducibility Crisis, a Comprehensive Set of Guides on XPS, and Better Data Fitting/Chemometrics of XPS Data

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

Expanding the Limits of Atom Probe Tomography

On Demand - Expanding the Limits of Atom Probe Tomography

Science of Metrology with Electrons