Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

Science of Metrology with Electrons

A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides

Development of Observation Method for Spatial Electromagnetic Fields by Using Conventional Scanning Electron/Ion Microscope

Simple Method to Determine the Rotation Between a TEM Image and Diffraction Pattern

Detectability & Sensitivity vs Incident Beam Energy in Modern Analytical Electron Microscopes

Effect of Sampling on Geometric Phase Analysis Sensitivity for Strain Measurement in Scanning Transmission Electron Microscopy

Integrated Nanophotonic Electron Beam Modulators Enable Ultra-High Precise Method for Calibrating EELS Spectrometers

A Low-Noise, Two-Channel STEM EBIC Metrology System

High-Speed, High-Precision, and High-Throughput Strain Mapping with Cepstral Transformed 4D-STEM Data

On Demand - Science Of Metrology With Electrons

Semiconductor Technology Challenges in High Volume Manufacturing of Semiconductors

The Role of Electron Microscopy in the Development of Monodisperse Cubic Iron Oxide Nanoparticles as Certified Reference Material for Size and Shape

Characterization of Mn Containing Precipitates Observed in 7Series Al Alloys Using Aberration Corrected STEM

Zinc Addition on AlCoFeNi Multicomponent System Produced by Mechanical Alloying, Microstructural and Morphological Effect

From Operando Microcell Experiments to Bulk Devices

Towards Quantification of the Reaction Product in Oxygen-Evolving Oxides by Operando Electron Energy-Loss Spectroscopy in Liquids

Benefits of Nanoscale Operando Experiments in Environmental Transmission Electron Microscopy for Solid Oxide Fuel Cell Devices

Water Condensation / Evaporation Experiments in ETEM using a Thermoelectric Microcooler

Effect of Induced Stimuli on the Leakage Current of Operative Oxide-based Devices inside a TEM

Probing Structural Changes in Nanoparticles During CO-Oxidation Reaction via in situ TEM

In-situ (S)TEM Study of Synthesis and Degradation Process of Titanium-Based MXene Lithium-ion Anodes

Relevance of In-Situ Electrochemical STEM Observations to Li-Metal Batteries for Evaluating Performance

Capturing Reaction Kinetics of Atomically Thin Device Materials by High-throughput in-operando SEM

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

Science of Metrology with Electrons

On Demand - Science Of Metrology With Electrons

From Operando Microcell Experiments to Bulk Devices