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Expanding the Limits of Atom Probe Crystallographic Analysis

Published online by Cambridge University Press:  22 July 2022

Andrew J. Breen
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia
Alec C. Day
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia
Felix Theska
Affiliation:
School of Materials Science and Engineering, UNSW, Sydney, NSW, Australia
Bryan Lim
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia
William Davids
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia
Sophie Primig
Affiliation:
School of Materials Science and Engineering, UNSW, Sydney, NSW, Australia
Simon P. Ringer*
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia
*
*Corresponding author: simon.ringer@sydney.edu.au

Abstract

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Type
On Demand - Expanding the Limits of Atom Probe Tomography
Copyright
Copyright © Microscopy Society of America 2022

References

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Invizo 6000 - 3D Atom Probe, https://www.cameca.com/products/apt/invizo-6000 (accessed February 10, 2022).Google Scholar
Lim, B et al. , Additive Manufacturing 46 (2021), p. 102121. doi:10.1016/j.addma.2021.102121CrossRefGoogle Scholar