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Are vacancies in field ion microscopy artefacts? A DFT study

Published online by Cambridge University Press:  22 July 2022

Shyam Katnagallu ,
Christoph Freysoldt  and
Joerg Neugebauer
Shyam Katnagallu*
Affiliation:
Computational Materials design, Max-Planck-Institut für Eisensforschung, Düsseldorf, Germany
Christoph Freysoldt
Affiliation:
Computational Materials design, Max-Planck-Institut für Eisensforschung, Düsseldorf, Germany
Joerg Neugebauer
Affiliation:
Computational Materials design, Max-Planck-Institut für Eisensforschung, Düsseldorf, Germany
*
*Corresponding author: s.katnagallu@mpie.de

Abstract

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Type
On Demand - Expanding the Limits of Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 754 - 755
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Copyright
Copyright © Microscopy Society of America 2022

References

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