Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 11 Issue s02
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 11 - Issue S02 - August 2005

Contents

Page 52 of 54

Radiation Effects in Materials

Research Article

  • Effect of Electron Flux on the Electronic-excitation-induced Phase Separation in GaSb Nanoparticles

  • H Yasuda, A Tanaka, K Ishiji, H Mori
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2052-2053
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Environmental Scanning Electron Microscopic Study Of Electron Impacted High Explosive Materials

  • S K Hait, B G Polke, S Venugopalan, B R Gandhe, A S Rao
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2054-2055
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Structure Modification of PbxCa10-x(VO4)6F2 Apatite under Electron Beam Irradiation

  • Z L Dong, T J White, K Sun, L M Wang, R C Ewing
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2056-2057
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Detection of the Spontaneous Change in the Burgers Vector of Perfect Dislocation Loops in Iron

  • K Arakawa, M Hatanaka, H Mori
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2058-2059
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • In–Situ TEM of Ion Irradiated Fe–Pt Alloy Nanostructures

  • G B Thompson, N W Morgan, R C Birtcher
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2060-2061
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Radiation Damage by Ar+ Ion-Milling in Ferroelectric Oxides.

  • K Z Baba-Kishi, C W Tai
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2062-2063
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • In situ TEM Study of Electron Beam Stimulated Organization of Three-dimensional Void Superlattice in CaF2

  • T H Ding, S Zhu, L M Wang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2064-2065
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Cavity Formation Study in SiC/SiC Composite Irradiated with Multiple-ion Beam at Elevated Temperatures

  • J–J Kai, H–T Keng, Z–H Zeng, F–R Chen
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2066-2067
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Semiconductors

Research Article

  • Zero-loss Filtered TEM Imaging of Microelectronic Structures Using In Column Filter Technology

  • H Stegmann, G Benner
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2068-2069
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • TEM Study of Oxygen Precipitation in Si Wafers with Backside Layers

  • R Yu, X F Zhang, Q Wang, M Daggubati, H Paravi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2070-2071
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • HRTEM Study of InN Films Grown on Sapphire - Evidence for a Cubic InN Structure

  • Z Liu, R J Kinsey, S M Durbin, S P Ringer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2072-2073
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Phase Shift of Reverse Biased p-n Junction Arrays by Fourier Methods

  • M Beleggia, P F Fazzini, G Pozzi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2074-2075
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Strain Relaxation of GaNyAs1-y Films on (100) GaAs Substrates Studied by Transmission Electron Microscopy

  • X Wu, J-M Baribeau, J A Gupta, M Beaulieu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2076-2077
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • TEM Characterization of Ag Precipitates in Screen Printed Ag Contacts for Si Solar Cells

  • K M Jones, Y Yan, M M Al-Jassim, M M Hilali
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2078-2079
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Scanning Electron Microscopy Cathodoluminescence Studies of Piezoelectric Fields in an InGaN Multiple Quantum Well Light-Emitting Diode

  • K L Bunker, R Garcia, P E Russell
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2080-2081
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Physical Properties of Hafnium-Silicate Transistor Gate Dielectric Stacks after Thermal Processing

  • B Foran, M Campin, M Clark, G Lian, C Johnson, G Bersuker, P Lysaght, R Rhoad
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2082-2083
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of Nanoscale Lattice Strains in Si CMOS by Convergent Beam Electron Diffraction (CBED)

  • J Huang, D K Cha, P R Chidambaram, R B Irwin, P J Jones, M J Kim
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2084-2085
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of Epitaxial Layer Defects in Silicon Wafers Using Focused Ion Beam and Transmission Electron Microscopy

  • J–H Cho, D–H Cho, C–W Lee, W–Y Kim, S–H Lim
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2086-2087
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Re-crystallisation of Amorphous Silicon in the Production of Low Defect Density Silicon on Sapphire Thin Films

  • W R McKenzie, H Domyo, T Ho, P R Munroe
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2088-2089
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electron Tomography of Microelectronic Device Interconnects

  • Q Yang, J Mardinly, C Kübel, C Nelson, C Kisielowski
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2090-2091
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 52 of 54