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Volume 11 - Issue S02 - August 2005

Contents

Page 50 of 54

Nanostructured materials

Research Article

  • Characterization of Co core Au shell Nanoparticles with Transmission Electron Microscopy

  • Y Bao, H A Calderon, K M Krishnan
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1970-1971
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nanostructural Evolution and Property of Silicates Doped with Er+3

  • K Hou, N Yao, C D Haines, V Ranganathan, S B Halpern, B H Kear, L C Klein, G H Sigel
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1972-1973
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Experimental Studies on Deformation in Nacre from Red Abalone

  • K Katti, D Katti, A Bhosle
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1974-1975
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • In-situ Studies of High Electrical-current Effects in Multiwalled Carbon Nanotubes Filled with Iron

  • K Svensson, H Olin, E Olsson
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1976-1977
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Direct Evidence of Shelled Structures of Au-Pd Bimetallic Nano-Particles

  • J P Zhang, D T Foord, J Chou, E W McFarland
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1978-1979
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • E-beam Nanolithographically Patterned Metal Oxide Nanowire Arrays for Highly Sensitive Gas Sensors

  • L Campbell A.D., D Smith, G May, L Caliste, Y Chen, W L Zhou
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1980-1981
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Oxidation

Research Article

  • Analysis of Pitting Corrosion in Aerospace Aluminium Alloy AA2024-T3

  • A P Boag, D G McCulloch, D N Jamieson, A E Hughes, L Pedrina, C G Ryan
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1984-1985
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Structural Characterization of Aluminum Oxidation due to Exposure to Hyperthermal Atomic Oxygen

  • L Li, T K Minton, J C Yang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1986-1987
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • TEM Observation of Oxide Scale Formed on a Ti-Al-Zr Alloy Oxidized at 3600 C in an Alkaline Steam

  • X T Zu, J Lian, Y Z Liu, L M Wang, Z G Wang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1988-1989
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Identification of Surface Precipitates Found on the Surface of Steel Annealed for Tinplating

  • P R Wilson, Z Chen
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1990-1991
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of the Hydrogen Damage in an API 5L X52 Steel by Scanning Electron Microscopy

  • R Réquiz, S Camero, A L Rivas
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1992-1993
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microstructure of Core-Shell Structured Iron-Iron Oxide Nanoparticles

  • C M Wang, D R Baer, L E Thomas, J E Amonette, S Thevuthasan, J Anthony, Y Qiang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1994-1995
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Post Test Analysis of Inconel-625 (HVOF) Coating Using SEM and EDS after Exposure to Erosion-Corrosion Test

  • H Y Al Fadhli, J Stokes, S Hashmi, B S Yilbas
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1996-1997
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A TEM Study of Oxide Scale on U-6Nb

  • R M Dickerson, P O Dickerson, R J Hanrahan
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1998-1999
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Particle Analysis

Research Article

  • TEM Investigation of GeO2 Concentration Profiles in GeO2-SiO2 Soot Particles from Preforms of Outside Vapor Deposition

  • S-C Cheng, J Liu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2000-2001
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Particle Atlas Comes of Age: A Brief History and a New Digital Tool for Today's Microscopist

  • E F Schumacher, J G Delly
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2002-2003
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Mica Aspect Ratios Measured by Scanning White Light Interference Microscopy

  • R A Rose, T B Vander Wood
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2004-2005
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Quantifying Size Errors of Particle Distribution Analysis Using Flatbed Scanner Images.

  • J L Mey, S Shukla, E A Mathez
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2008-2009
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Power of Low kV Microscopy in Sub-Micron Size Defect Analysis

  • S Mansour, C Alapa
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2010-2011
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 50 of 54