FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences
Research Article
Some Charge Control Criteria for Focused Ion Beam Milling of Insulators and Biological Specimens using a Quanta 3D DualBeam ESEM
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 804-805
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Focused Ion Beam Sculpting Curved Shapes
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 806-807
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Sculpting Needle-Shaped Atom Probe Specimens with a Dual Beam FIB
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 808-809
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Nano Factory Achieved by Focused Ion Beam
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- 01 August 2005, pp. 810-811
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GaN(x)As(1-x) Quantum Structures Fabricated by FIB Patterning
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 812-813
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Selective Electron Beam Erosion and Deposition of Materials
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 816-817
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In-situ Electrical Characterization of Nano-Interconnect Structure in FIB
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- 01 August 2005, pp. 818-819
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Methods for Structuring and Prototyping on a Nanoscale Using a DualBeam
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- 01 August 2005, pp. 820-821
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Maskless Fabrication of Highly-Ordered Periodic Nanopillars using FIB and Bitmap Control
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- 01 August 2005, pp. 822-823
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Feedback Control of Gas Chemistry Reactions in the FIB
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 824-825
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Folded Cavity Surface Emitting Lasers Fabricated by Focused Ion Beam Etching
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 826-827
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2 keV Ga+ FIB Milling for Reducing Amorphous Damage in Silicon
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- 01 August 2005, pp. 828-829
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A Three Beam Approach to TEM Preparation Using In-situ Low Voltage Argon Ion Final Milling in a FIB-SEM Instrument
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- 01 August 2005, pp. 830-831
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FIB Microscopy of Martian Meteorite ALH84001 Carbonate Disks
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 832-833
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Shadow FIBing- Using Geometry to Prepare TEM Samples
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 834-835
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Three-Dimensional Reconstruction of Alpha Laths in Alpha/beta Titanium Alloys by Serial Sectioning with a FEI NOVA
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 836-837
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Mechanical Conversion for High-Throughput TEM Sample Preparation
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 838-839
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Ion Beam Preparation Procedures for Three-dimensional SEM Resolved Kikuchi (EBSD) and Kossel Microdiffraction Analysis of Deformed Metals
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 840-841
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Cross-Sectioning of Plan-View Samples and Artifacts of TEM Sample Preparation
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 842-843
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Dual Beam Approach to Nano-Scale Defect Correction of High-End Photolithographic Masks
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 844-845
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