Scanning Electron Microscopy (SEM)
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Electron Beam-Induced Sample Contamination in the SEM
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- 01 August 2005, pp. 764-765
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Nano-tip Electron Gun for the Scanning Electron Microscope
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 766-767
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Absolute Calibration of Auger Spectrometer for Measuring SE and BSE Yield
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- 01 August 2005, pp. 768-769
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A Comparison of the Appearance of Various High Resolution Sputter Coatings
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- 01 August 2005, pp. 770-771
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Quantitative Film Thickness Measurement Using Scintillator/Photomultiplier Backscattered Electron Detectors. Possible or Not?
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- 01 August 2005, pp. 772-773
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SEM Analysis of Composite Cellulose Acetate Membranes for Separation Operations
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- 01 August 2005, pp. 774-775
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Crystallography
Research Article
Residual Strain Measurement of SOI Wafer Using Convergent Beam Electron Diffraction
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- 01 August 2005, pp. 776-777
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The Powder Diffraction File (PDF): A Relational Database For Electron Diffraction
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- 01 August 2005, pp. 778-779
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Electron Precession for Routine Crystallography
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- 01 August 2005, pp. 780-781
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Convergent Beam Electron Diffraction of Ordered L10 Nanoparticles
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- 01 August 2005, pp. 782-783
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Confocal Microscopy
Research Article
Confocal Holography: Improved Resolution Through Object Scanning
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- 01 August 2005, pp. 784-785
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Quantitative FRAP by Means of Diffusion through 3D Polyelectrolyte Shells Using Confocal and Two-photon Excitation Approaches.
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- 01 August 2005, pp. 786-787
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Practical Advances in Raman Microscopy
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- 01 August 2005, pp. 788-789
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In Vivo Confocal Raman Microspectroscopy of the Skin: Effect of Skin Care Products on Molecular Concentration Depth-Profiles
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- 01 August 2005, pp. 790-791
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Nanoindentation-Induced Phase Transformations in Ge Studied by Electron Microscopy and Raman Spectroscopy
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- 01 August 2005, pp. 792-793
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High Z Metal Carbonyls for Imaging and Microspectroscopy
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- 01 August 2005, pp. 794-795
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Advances in Infrared Microprobe Instrumentation: Integration of Image Analysis and Molecular Spectroscopy
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- 01 August 2005, pp. 796-797
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FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences
Research Article
The Application of Focused Ion Beam (FIB) on Biological Samples
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- 01 August 2005, pp. 798-799
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Investigation of the Interface Between Biological Cell Tissue and Hard Substrate Materials using CrossBeam Technology
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- 01 August 2005, pp. 800-801
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Feasibility of Focused Ion Beam Milling for Preparation of TEM Specimens of Biological Material Embedded in Vitreous Ice
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- 01 August 2005, pp. 802-803
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