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Volume 11 - Issue S02 - August 2005

Contents

Page 18 of 54

Advances in Microstructurial Characterization Techniques

Research Article

  • Confocal μ–XRF and μ–XAFS Studies of an Uranium-Rich Sediment from a Nuclear Waste Disposal Natural Analogue Site

  • M A Denecke, K Janssens, J Rothe, U Noseck, R Simon
  • Published online by Cambridge University Press:
    01 August 2005, pp. 684-685
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

In-situ Electron Microscopy: A Practical Tutorial

Research Article

  • In-situ Electron Microscopy: A Practical Tutorial

  • E A Stach
  • Published online by Cambridge University Press:
    01 August 2005, pp. 686-687
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

What is Fluctuation Electron Microscopy?

Research Article

  • Fluctuation Electron Microscopy for the MASses

  • M M J Treacy
  • Published online by Cambridge University Press:
    01 August 2005, pp. 688-689
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Metallographic Techniques and Applications

Research Article

  • Ductile Iron Nodularity Assessment: A Comparison Between Various Manual Procedures and Image Analysis

  • O D Baron, G Lucas
  • Published online by Cambridge University Press:
    01 August 2005, pp. 690-691
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Two Examples of Award Winning Metallography

  • F Noecker
  • Published online by Cambridge University Press:
    01 August 2005, pp. 692-693
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Color Etching of Mg-Al Alloys

  • A Maltais, M Fiset, D Dubé
  • Published online by Cambridge University Press:
    01 August 2005, pp. 694-695
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microstructure of Powder Metallurgy Components

  • G Vander Voort, E Manilova
  • Published online by Cambridge University Press:
    01 August 2005, pp. 696-697
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Using Metallography, Scanning Electorn Microscope and Energy Dispersive Spectroscopy Techniques to Enhance Failure Analysis on Aerospace Componets

  • W Heady
  • Published online by Cambridge University Press:
    01 August 2005, pp. 698-699
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microstructural Analysis of 5XXX Series Aluminum Alloys for Optimal Strength and Corrosion Resistance

  • K Unocic, M Mills, G Daehn, P Kobe
  • Published online by Cambridge University Press:
    01 August 2005, pp. 700-701
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Polymer Sample Preparation for Electron Microscopy

  • A Schrand
  • Published online by Cambridge University Press:
    01 August 2005, pp. 702-703
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Advances in Instrumentation and Technique

Research Article

  • Design of an Analytical TEM/STEM with 0.3 srad EDX Detection

  • H S von Harrach, P C Tiemeijer, J Ringnalda
  • Published online by Cambridge University Press:
    01 August 2005, pp. 704-705
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Development and Application of a New 200kV TEM/STEM System with an LaB6 Electron Gun

  • I Ishikawa, K Yamazaki, E Okunishi, N Endo
  • Published online by Cambridge University Press:
    01 August 2005, pp. 706-707
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • 200 kV TEM with a Zernike Phase Plate

  • S Motoki, F Hosokawa, Y Arai, R Danev, K Nagayama
  • Published online by Cambridge University Press:
    01 August 2005, pp. 708-709
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Detection of Interstitial Atoms by Hollow-Cone Illumination HAADF-STEM

  • K Saitoh, N Tanaka
  • Published online by Cambridge University Press:
    01 August 2005, pp. 710-711
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • 0.60 eV Energy Resolution in EELS Using a Depleted Thermionic LaB6-Cathode

  • C Mitterbauer, W Grogger, G Kothleitner, R Spehr, P Tiemeijer, F Hofer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 712-713
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Comparison of SCEM and STEM-HAADF Imaging in Thick Specimens

  • N J Zaluzec, J Hiller
  • Published online by Cambridge University Press:
    01 August 2005, pp. 714-715
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Applications of a Bayesian Based Maximum Entropy Method to Energy Dispersive X-ray Spectra

  • T Shinkawa, N Nakamura, H Kato, K Shibuya, M Nakata
  • Published online by Cambridge University Press:
    01 August 2005, pp. 716-717
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • HARECES Measurements of Carbon K Shell Excitation in Graphite

  • N J Zaluzec, M G Blackford, K L Smith, M Colella
  • Published online by Cambridge University Press:
    01 August 2005, pp. 718-719
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Measurement of Crystal Symmetry using HARECXS

  • N J Zaluzec
  • Published online by Cambridge University Press:
    01 August 2005, pp. 720-721
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 18 of 54