Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley
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Electron Holography with Variable Magnification for Semiconductor Device Characterization
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- 01 August 2005, pp. 564-565
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The Characterization of Bulk Plasmons and Bulk Phonons Using Energy-filtered Diffracted Beam Holography and Energy-filtered Kossel-imaging Holography
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- 01 August 2005, pp. 566-567
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Evaluation of Electric Potential Distribution near FEG-Emitter by Electron Holography
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- 01 August 2005, pp. 568-569
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Electron Holography and Imaging Capabilities of the JEOL 2100F-LM
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- 01 August 2005, pp. 570-571
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The Side-Effects of a Non-Mechanical Shutter in the Gun Area of a Transmission Electron Microscope for Off-Axis Electron Holography
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- 01 August 2005, pp. 572-573
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Strain Mapping of Interfaces by Quantitative High-Resolution TEM
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- 01 August 2005, pp. 574-575
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Image-Based Nanocrystallography by Means of Tilt Protocol / Lattice Fringe-Fingerprinting: Proof of Principle on TiO2 Nanoparticles
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- 01 August 2005, pp. 576-577
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Interfaces in Next Generation Ta and NbO Solid Electrolytic Capacitors
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- 01 August 2005, pp. 578-579
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Structural Characterization of Nano-Oxide Layers in PtMn Based Specular Spin Valve Thin Films
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- 01 August 2005, pp. 580-581
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Magnetization Reversal of Modified Circular Nanoscale Ferromagnetic Elements
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- 01 August 2005, pp. 582-583
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Electron Holographic Observation of a Micro-Magnetic Field Current Generated from a Helical Carbon Coil
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- 01 August 2005, pp. 584-585
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Sample Preparation for Precise and Quantitative Electron Holography Analysis of Electrostatic Potential in Semiconductor Devices
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- 01 August 2005, pp. 586-587
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Mean Inner Potentials in Oxidized Germanium Nanowires by Electron Holography
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- 01 August 2005, pp. 588-589
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An Alternative Explanation for Diffractive Imaging Technique
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- 01 August 2005, pp. 590-591
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Using Iteration Algorithm to Solve the Twin Image Problem for Shadow Imaging
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- 01 August 2005, pp. 592-593
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Coherent Scattering in the STEM
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- 01 August 2005, pp. 594-595
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Mapping of Two Dimensional Doping Areas in CMOS Device by Using Transport of Intensity Equation
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- 01 August 2005, pp. 596-597
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Nanofabrication and Growth Processes with Ultra-High Resolution Electron Beam Induced Deposition on Thin Films
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- 01 August 2005, pp. 598-599
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Calculations of HREM Image Intensity Using Monte Carlo Integration
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- 01 August 2005, pp. 600-601
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Theory and Applications of Focal-Series Reconstruction in HRTEM
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Theory and Applications of Focal-Series Reconstruction in HRTEM
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- 01 August 2005, pp. 602-603
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