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Development and Application of a New 200kV TEM/STEM System with an LaB6 Electron Gun

Published online by Cambridge University Press:  01 August 2005

I Ishikawa ,
K Yamazaki ,
E Okunishi  and
N Endo
I Ishikawa
Affiliation:
JEOL, Ltd., Tokyo, Japan
K Yamazaki
Affiliation:
JEOL, Ltd., Tokyo, Japan
E Okunishi
Affiliation:
JEOL, Ltd., Tokyo, Japan
N Endo
Affiliation:
JEOL, Ltd., Tokyo, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 706 - 707
Copyright
© 2005 Microscopy Society of America