Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Realtime Up-sampling Noise Filter: Paradigm Shift for Data Acquisition

Electron Energy-loss Spectroscopy Using MerlinEM - Medipix3 Detector

Transforming Transmission Electron Microscopy with MerlinEM Electron Counting Detector

Beam Energy Dependent Calibration of STEM and BSE Detectors for Thin Film Thickness Estimation

Direct Phase Imaging with Coherent Electron Beam in TEM

Electron Holography Investigation of Resistive Switching CeO2 / STO Nanocolumns

2D Evaluation of the Potential Difference in an InP Device by Shadow Image Distortion Method

Accurate Measurement of Electric Potential Distributions at the Interfaces in Solids Using Phase-shifting Electron Holography

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy III - Applications to Interface Chemistry

Measuring Viscoelastic Master Curves at the Nanoscale in Polymer Composites

High-resolution Viscoelastic Mapping of Cells with FT-NanoDMA Mode of AFM

Nanomechanical Insights into Voxel-scale Photopolymer Cure

Scanning Ion Conductance Microscopy (SICM) for Low-stress Directly Examining of Cellular Mechanics

High-Resolving Power, Multi-Modal and Correlative SIMS Imaging in Biology, Geology and Materials

Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments

npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations

Vendor Symposium - Materials Preparation

LaserFIB – the New All-in-one Tool to Speed up Sample Preparation for APT

Automation of In-trench TEM Lamella Workflow Increasing Throughput for Lift-out

Advances in Large-area Sample Preparation Using Broad Argon Ion Beam Milling for Multiphase Materials

Towards the Nanoscale-ultrathin Metal Coatings as a Solution for Imaging of Fine-scale Structures

PhysicalBrickDatum: A Deep Physical Model for N-Dimensional Microscopy Data

A Path to EUV Photoresist Reference Metrology Using Restricted Tilt Electron Tomography

The Promise of Cryo-Electron Tomography

In Situ Structural Analysis of Bacterial Nanomachines by Combining Cryo-FIB Milling, Cryo-ET and Sub-tomogram Analysis

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Direct Phase Imaging with Coherent Electron Beam in TEM

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy III - Applications to Interface Chemistry

High-Resolving Power, Multi-Modal and Correlative SIMS Imaging in Biology, Geology and Materials

Vendor Symposium - Materials Preparation

The Promise of Cryo-Electron Tomography