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2D Evaluation of the Potential Difference in an InP Device by Shadow Image Distortion Method

Published online by Cambridge University Press:  30 July 2020

Katsuhiro Sasaki
UACJ Coporation, Nagoya, Aichi, Japan
Hirokazu Sasaki
Furukawa Electric Co. Ltd., Yokohama, Kanagawa, Japan


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Direct Phase Imaging with Coherent Electron Beam in TEM
Copyright © Microscopy Society of America 2020


Chapman, J. N., J. Phys. D, 17 (1984) p. 623.10.1088/0022-3727/17/4/003CrossRefGoogle Scholar
Tonomura, A., Reviews of Modern Physics, 59 (1987) p. 639.10.1103/RevModPhys.59.639CrossRefGoogle Scholar
Shabata, N., et al. ., Scientific Reports 5 (2015) 10040.Google Scholar
Sasaki, K., et al. ., in “The Transmission Electron Microscope”, ed. M. Khan, (InTech, Rijeka) p.1.Google Scholar
Sasaki, K., Sasaki, H. and Saito, S., Microsc. Microanal. 24 (Suppl. 1), (2018) p.26.10.1017/S1431927618000624CrossRefGoogle Scholar
Takahashi, H., et al. ., Proc. 16th Int. Microscopy Congress (2006) p.1104.Google Scholar
Sasaki, K., et al. ., Microsc. Microanal. 25 (Suppl 2) (2019), p.106.10.1017/S1431927619001260CrossRefGoogle Scholar