Hostname: page-component-77c89778f8-sh8wx Total loading time: 0 Render date: 2024-07-24T17:46:54.727Z Has data issue: false hasContentIssue false

npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations

Published online by Cambridge University Press:  30 July 2020

Olivier De Castro
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Belvaux, Grevenmacher, Luxembourg
Antje Biesemeier
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Belvaux, Grevenmacher, Luxembourg
Eduardo Serralta
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Sachsen, Germany
Nico Klingner
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Sachsen, Germany
Gregor Hlawacek
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Sachsen, Germany
Peter Gnauck
Affiliation:
Carl Zeiss Microscopy GmbH, ZEISS Group, Oberkochen, Baden-Wurttemberg, Germany
Serge Duarte Pinto
Affiliation:
Photonis Netherlands B.V., Roden, Drenthe, Netherlands
Falk Lucas
Affiliation:
ETH Zurich, Zurich, Zurich, Switzerland
Cecilia Bebeacua
Affiliation:
ETH Zurich, Zurich, Zurich, Switzerland
Tom Wirtz
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Belvaux, Grevenmacher, Luxembourg

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
High-Resolving Power, Multi-Modal and Correlative SIMS Imaging in Biology, Geology and Materials
Copyright
Copyright © Microscopy Society of America 2020

References

Eswara, S., Pshenova, A., Yedra, L., Hoang, Q. H., Lovric, J., Philipp, P. and Wirtz, T.; Appl. Phys. Rev. 6, 021312 (2019).10.1063/1.5064768CrossRefGoogle Scholar
Gratia, P., Zimmermann, I., Schouwink, P., Yum, J.-H., Audinot, J.-N., Sivula, K., Wirtz, T. and Nazeeruddin, M. K.; ACS Energy Lett. 2017, 2, p. 2686-2693.10.1021/acsenergylett.7b00981CrossRefGoogle Scholar
Lovric, J., Audinot, J.-N. and Wirtz, T.; Microsc. Microanal. 25 (Suppl 2), 2019.10.1017/S1431927619005865CrossRefGoogle Scholar
Boverhof, D. R. and David, R. M.; Anal. Bioanal. Chem. 396 (2010), p. 953-961.10.1007/s00216-009-3103-3CrossRefGoogle Scholar
Ward, B. W., Notte, J. A., Economou, N. P.; J. Vac. Sci. Technol. B 24/6 (2006), 2871.10.1116/1.2357967CrossRefGoogle Scholar
Wirtz, T., Dowsett, D., Philipp, P.; SIMS on the helium ion microscope: a powerful tool for high-resolution high sensitivity nano-analytics; Helium Ion Microscopy (2016), ed. G. Hlawacek, A. Golzhäuser, 297.Google Scholar
Dowsett, D., Wirtz, T.; Anal. Chem. 89 (2017), 8957.10.1021/acs.analchem.7b01481CrossRefGoogle Scholar
Wirtz, T., De Castro, O., Audinot, J.-N., Philipp, P.; Ann. Rev. Anal. Chem. 12 (2019).10.1146/annurev-anchem-061318-115457CrossRefGoogle Scholar
This project has received funding from the European Union's Horizon 2020 Research and Innovation Programme under grant agreement No. 720964.Google Scholar