Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 16 supplement s2
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 16 - Supplement S2 - July 2010

Contents

Page 48 of 50

Physical Sciences Symposia

3DEM: Quantitative Analysis at the Nano and Microscale using Tomographic Techniques

Abstract

  • Influence of Precipitation Sequence on the 3D TaC + Ta2C/Ta4C3 Microstructure Processed by Vacuum Plasma Spraying

  • R Morris, D Butts, P Shade, GB Thompson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1882-1883
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Investigation of Ultra High Strength Steel with 3DTEM and 3D Atom Probe

  • M Hartshorne, C McCormick, P Novotny, M Schmidt, DN Seidman, M Taheri
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1884-1885
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Electron Tomography of Si and Er Particles in SiOx film Without Missing Wedge

  • P Li, P Concepcion, X Wang, M Malac, A Meldrum
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1886-1887
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Inside Modern Micro-devices at the Atomic Scale

Abstract

  • Structure and Composition of Metal-Doped HfO2 Gate Oxides in CMOS Devices Studied by High Resolution STEM and EELS

  • J Bruley, MM Frank, V Narayanan, B Mendis, M Gass
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1892-1893
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Composition Analysis of a Thin Gate Oxide Layer Using Model-Based EELS Quantification

  • Q Jin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1894-1895
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • HRTEM and Nano-Beam Diffraction Analysis of Metal-Molecule Interface

  • P Li, J Chen, M Malac, H Yan, A Bonifas, R McCreery
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1896-1897
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Silicon Chip Teardown to the Atomic Scale – Challenges Facing the Reverse Engineering of Semiconductors

  • D James
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1898-1899
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Modern Integrated Circuits: The Ultimate Engineered Material

  • E Keyes, J Abt, L Gunawan
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1900-1901
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • An Interface Study Using Electron Energy-Loss Near-Edge Structure

  • Q Jin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1902-1903
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Composition Modulation in High-k Hafnium Silicate Films

  • X Wu, J Liu, WN Lennard, D Landheer
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1904-1905
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Challenges and Opportunities in Characterizing Modern Nano-Devices

  • L Pan, X Lin, B Miner, K Johnson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1906-1907
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • STEM/EDS Spectral Imaging of Magnetic Tunnel Junction Nano-Devices

  • P Zhang, H Wang
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1910-1911
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Three-Dimensional Characterization of Magnetic Tunnel Junctions for Read Head Applications by Atom-Probe Tomography

  • DK Schreiber, Y-S Choi, Y Liu, DN Seidman, AK Petford-Long
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1912-1913
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Automatic Quantitative Measurements In SEM

  • S Babin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1916-1917
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Energy Filtered Nano-Diffraction Application in Growth Orientation Analysis of Magnetic Thin Films

  • L Chen, H Wang
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1918-1919
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Three-Dimensional Imaging of Semiconductor Device Structure Using Contrast Tuning EFTEM Tomography

  • Q Jin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1920-1921
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 48 of 50