Abstract
“Standardless” Quantitative Electron Beam X-ray Microanalysis: The Situation Remains caveat emptor!
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1464-1465
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Quantitative Microanalysis at Low kV : Precautions and Validation
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1466-1467
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Standardless EDS Quantitative Analysis at High Tilt Angles
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1468-1469
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Evaluation of Current Standardless Quantitative Analysis Programs using Energy Dispersive Spectrometry in the SEM
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1470-1471
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X-Ray Analysis Of Rough Surfaces At Low Energy
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1472-1473
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Quantitative X-Ray Microanalysis with a Low Voltage Scanning Electron Microscope
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1474-1475
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Pu-Ga Standards for Microanalysis and Matrix Correction Development
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1476-1477
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X-ray Microanalysis of Insulators in a Variable Pressure Environment
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1478-1479
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Testing EDS performance in ESEM
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1480-1481
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SEM-EDS Quantitative Analysis of Aerosols ≥ 80nm: Impacts on Atmospheric Aerosol Characterization Campaigns
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- 01 August 2002, pp. 1482-1483
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Quantitative Analysis of Yttrium Barium Copper Oxide Films on Strontium Titanate
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1484-1485
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Measurements of Absolute X-ray Generation Efficiency
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1486-1487
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Chemical characterization of optical data storage materials by EPMA
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1488-1489
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Chemical Characterization of Silicon-Germanium Single Crystals – Initial Evaluation of the Extent of Heterogeneity
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1490-1491
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EPMA Characterization of Residual Al Content in Oxidized High-Temperature Alloys
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1492-1493
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Low Background Glass Substrates for Microanalysis
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1494-1495
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Absorption Correction Of Fe Lα,β Emission From Iron Oxides
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1496-1497
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WinX-Ray: A New Monte Carlo Program for the Simulation of X-Ray and Charging Materials
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1498-1499
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Spatially Resolved Improved FT–IR Microspectroscopy of Deuterated Species in Tissue
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1498-1499
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Spatially Resolved Improved FT–IR Microspectroscopy of Deuterated Species in Tissue
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1502-1503
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