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X-ray Microanalysis of Insulators in a Variable Pressure Environment

Published online by Cambridge University Press:  01 August 2002

M. Toth ,
J.P. Craven ,
M.R. Phillips ,
B.L. Thiel  and
A.M. Donald
M. Toth
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 0HE, U.K.
J.P. Craven
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 0HE, U.K.
M.R. Phillips
Affiliation:
Microstructural Analysis Unit, University of Technology Sydney, Broadway, NSW 2007, Australia
B.L. Thiel
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 0HE, U.K.
A.M. Donald
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 0HE, U.K.

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1478 - 1479
Copyright
Copyright © Microscopy Society of America 2002