Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

Using Wavelets to Adjust Focusing of a Scanning Electron Microscope

Locating Atoms in Small Crystals by Combining Convergent Beam Electron Diffraction and Electron Channeling

Comparison of Detection Limits for Elemental Mapping by EF-TEM and STEMXEDS

The relevance of imaging and analytical electron microscopy in the understanding of heterogeneous selective oxidation catalysis

Comparative ELNES Measurements on Selected Transition Metal Oxides on a New High Energy-Resolution Spectrometer / Monochromator TEM

Density Functional Theory as a Tool for the Electron Microscopist

Nanostructures and Defects in Several Materials under Electropulsing

Sb Grain Boundary Segregation in Rapidly Solidified Cu-Sb Alloy

Reduction of PtO2 Powders (Adam's Catalyst) under Electron Beam Irradiation

Phonon Scattering in Quantitative High-Resolution Electron Microscopy – effects, problems and approaches

Z-Contrast Imaging of Dislocation Cores at the Si/GaAs Interface

The Study of Intergranular Segregation and Elemental Partitioning in Partially Molten Olivine-bearing Geological Composites by STEM-EDX

Nanobelt Thickness and Mean-free Path Determination by CBED and PEELS

EFTEM and its Application in Cryo Electron Microscopy

The Optimization of EDX Performance in Tecnai TEMs

Imaging Single Dopant Atoms and Nanoclusters in Highly n-type Bulk Si

Multi-Electrode Samples for TEM Studies of Corrosion

Structure Characterization of ZnSe/GaMnAs Quantum Well on GaAs Substrate

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract